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Optical profilometer

The Profilm3D® optical profiler uses a state-of-the-art non-contact optical method for measuring surface profiles and roughness, white light interferometry (WLI). White light interferometry...

MOED
Parylene Coating System - Diener Parylene P6

The Parylene P6 coating system is the most compact parylene deposition tool available, still with a chamber size of 20 x 20 cm2. It is compatible with...

MOED
Penn PhD PR M2

The Photoreactor M2 is an advanced benchtop instrument designed for chemists and researchers seeking to accelerate chemical reactions using Photoredox Catalysis. With the M2, research parameters are in your control, enabling greater standardization, repeatability, traceability, efficiency, and...

RTMM
Photoluminescence Spectrometer - Edinburgh FLS100

The system is a modular fluorescence and phosphorescence spectrometer for measuring spectra from the ultraviolet to the near infrared spectral range, and lifetimes spanning from picoseconds to...

MOED
Potentiostat/Galvanostat - Gamry Interface 5000E

The Interface 5000 is designed for testing of batteries, supercapacitors, and solar cells.  The system provides a full suite of electrochemical techniques...

MOED
Profilometer

KLA Alpha Step D500 Stylus Profiler - With 30 mm scan length - Vertical range: 0 - 1200 ?m - Force range: 0.03 - 15 mg Manual sample stage - 140 mm diameter chuck - XY stage movement: 20 x 80 mm

RTMM
Pulsed Laser Deposition (PLD) system - Lam Research

Pulsed Laser deposition (PLD) utilizes a high-power pulsed laser to vaporize a target material. This technique, crucial in microelectronics and nanotechnology, enables the growth of high-quality...

MOED
SPEX SamplePrep 8000D Mixer/Mill

The 8000D Mixer/Mill grinds up to 0.2 – 10 grams of dry, brittle samples, or mixes up to 50 mL of material per clamp. It reduces samples to analytical fineness and can be utilized for mechanochemistry, mechanical alloying, slurry grinding, blending powders and mixing emulsions

FUNIMAT
Sputtering deposition chamber - Angstrom Engineering

Sputtering employs radio frequency energy in a vacuum to create an ionized argon plasma, which collides at high kinetic energies with a target material, causing atoms to be ejected and sublimated....

MOED
TFA - Thin Film Analyzer - LINSEIS

The Thin Film Analyzer is utilized for characterizing a diverse array of thin film samples, including organic semiconductor or thermoelectric thin films. It facilitates measurements of Van der Pauw...

MOED
Total: 10
With the support of:
Ayuda CEX2019-000919-M financiada por: