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Our mission is to address global energy challenges through the development of highly efficient optoelectronic devices.
For this, we use unconventional materials, such as molecular semiconductors and metal halide perovskites, as they combine ease of processing with unique physical properties. We process these materials into thin films using both solution and vacuum based coating methods, and study their properties to implement them into functional structures targeting specific applications. The core activities are directed towards thin-film photovoltaics, electroluminescence, and sensing.
The C9920-02 absolute quantum yield spectrometer employs photoluminescence method to measure absolute quantum yields quick and accurately. The setup comprises an excitation light source, monochromator, an integrating sphere and a CCD spectrometer for detecting the whole spectral range...
With ALD, ultra-thin films are created through a precise, sequential exposure of a substrate to gas phase precursors, resulting in controlled layer-by-layer deposition with atomic proportions and pin-hole free morphology conformal to the substrate\'s shape. ALD finds...
The QE-R system allows the measurement of EQE, IPCE, IQE and RS, accurately and quickly. This allows studying different device architectures, their losses, band gaps, among others. The system...
This vacuum chamber allows us to sublime materials in high vacuum (10-6 mbar), which are deposited homogeneously as films into...
El sistema de espectroscopia de fotoemisión a presión ambiente (APS) mide la función de trabajo absoluta de un material por fotoemisión en condiciones ambientales. El rango de excitación de APS es de 3.4 eV a 7.0 eV, lo que significa que APS es capaz...
The SINUS-70 ADVANCED delivers class-leading A++ spectrum that starts at 350 nm and extends out to as much as 1,200 nm. Multiple individually controlled sets of LEDs allow us to analyze the...
The Alpha-Step D-500 profilometer allows to measure the thickness of thin layers with a precision of +/- 5 nm, as well as to make 2D measurements with height, roughness, curvature and step strain. The innovative optical toggle sensor technology offers high resolution measurements, large vertical...
The Profilm3D® optical profiler uses a state-of-the-art non-contact optical method for measuring surface profiles and roughness, white light interferometry (WLI). White light interferometry...
The Parylene P6 coating system is the most compact parylene deposition tool available, still with a chamber size of 20 x 20 cm2. It is compatible with...
The system is a modular fluorescence and phosphorescence spectrometer for measuring spectra from the ultraviolet to the near infrared spectral range, and lifetimes spanning from picoseconds to...
The Interface 5000 is designed for testing of batteries, supercapacitors, and solar cells. The system provides a full suite of electrochemical techniques...
Pulsed Laser deposition (PLD) utilizes a high-power pulsed laser to vaporize a target material. This technique, crucial in microelectronics and nanotechnology, enables the growth of high-quality...
Sputtering employs radio frequency energy in a vacuum to create an ionized argon plasma, which collides at high kinetic energies with a target material, causing atoms to be ejected and sublimated....
The Thin Film Analyzer is utilized for characterizing a diverse array of thin film samples, including organic semiconductor or thermoelectric thin films. It facilitates measurements of Van der Pauw...
